桌上型掃描式電子顯微鏡

產品型號：EM-30N

EM-30N 是 COXEM 面向奈米機電一體化時代持續投入技術和開發的產物，即使在高倍率下也能提供無雜訊的清晰影像，其全景功能可掃描更廣闊的區域。
此外，它還與 EDS 完全相容，從而最佳化了效能。EM-30N 的性能和價格都令人滿意，它將在所有研究領域大放異彩，為先進技術的開發和利用提供卓越的成果。

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產品特點
規格
相關內容3
相關內容4

應用

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	EM-30N	EM-30AXN
放大倍率	15-150,000X
空間解析度	30kV 時 < 5nm
真空模式	HV (標準)
加速電壓	1 - 30 kV（可依 1 kV比例調整）
電子源	預定心鎢絲燈芯
探測器	SED(DP), BSED(DP)	SED(DP), BSED(DP), EDS
樣品尺寸	70mm (W) x 45mm (H)
X-Y/T 橫移	35x35mm / 0 - 45º
自動控制	對焦、燈絲、亮度/對比
數據輸出格式	jpg, tiff, BMP
尺寸	400 x 600 x 550 mm
重量	85 kgs
可選購	STEM CoolStage Panorama 2.0 30mm Active Size Compact Type EDS (Particle Analysis) 30mm Active Size Compact Type EDS (MPO included)

EM-30N, which is a product of COXEM ’s steady investment for technology and development with a view to the era of nano-mechatronics, can deliver clear images without noise even at high magnification and scan an even wider area with its panorama feature. Also, its full compatibility with EDS delivers optimized performance. Satisfactory both in performance and price, EM-30N will shine in all research areas and deliver superb results to the development and utilization of advanced technology.

application

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	EM-30N	EM-30AXN
Magnification	15-150,000X
Spatial Resolution	< 5nm at 30kV
Vacuum Mode	HV (Standard)
Acceleration Voltage	1 - 30 kV(adjustable in 1kV scale)
Electron Source	Pre-Centered Tungsten Filament
Detector	SED(DP), BSED(DP)	SED(DP), BSED(DP), EDS
Sample Size	70mm (W) x 45mm (H)
X-Y/T Traverse	35x35mm / 0 - 45º
Automation	Focus, Filament, Brightness/Contrast
Data Output Format	jpg, tiff, BMP
Dimensions	400 x 600 x 550 mm
Weight	85 kgs
Options	STEM CoolStage Panorama 2.0 30mm Active Size Compact Type EDS (Particle Analysis) 30mm Active Size Compact Type EDS (MPO included)

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